Quantum Imaging and Metrology
Quantum Physics
2007-05-23 v1
Abstract
The manipulation of quantum entanglement has found enormous potential for improving performances of devices such as gyroscopes, clocks, and even computers. Similar improvements have been demonstrated for lithography and microscopy. We present an overview of some aspects of enhancement by quantum entanglement in imaging and metrology.
Cite
@article{arxiv.quant-ph/0306113,
title = {Quantum Imaging and Metrology},
author = {Hwang Lee and Pieter Kok and Jonathan P. Dowling},
journal= {arXiv preprint arXiv:quant-ph/0306113},
year = {2007}
}
Comments
6 pages, 3 figures: Proceedings of the Sixth International Conference on Quantum Communication, Measurement and Computing, edited by J. H. Shapiro and O. Hirota (Rinton Press, 2002)