A perspective on multiparameter quantum metrology: from theoretical tools to applications in quantum imaging
Quantum Physics
2020-06-22 v2
Abstract
The interest in a system often resides in the interplay among different parameters governing its evolution. It is thus often required to access many of them at once for a complete description. Assessing how quantum enhancement in such multiparameter estimation can be achieved depends on understanding the many subtleties that come into play: establishing solid foundations is key to delivering future technology for this task. In this article we discuss the state of the art of quantum multiparameter estimation, with a particular emphasis on its theoretical tools, on application to imaging problems, and on the possible avenues towards the next developments.
Keywords
Cite
@article{arxiv.1911.12067,
title = {A perspective on multiparameter quantum metrology: from theoretical tools to applications in quantum imaging},
author = {Francesco Albarelli and Marco Barbieri and Marco G. Genoni and Ilaria Gianani},
journal= {arXiv preprint arXiv:1911.12067},
year = {2020}
}
Comments
14 pages, 1 figure. Comments are welcome