English

Pt/Ti/Al2O3/Al tunnel junctions showing electroforming-free bipolar resistive switching behavior

Materials Science 2015-05-27 v1

Abstract

We investigated electroforming-free bipolar resistive switching behavior in Pt/Ti/Al2O3/Al tunnel junctions where the Al2O3 tunnel barrier was naturally formed on Al in air. Various compliance current values for the junction's set switching successfully lead to various resistance values in its low resistance state, suggesting the possibility for multi-level-operation. A mechanism for the bipolar switching is qualitatively discussed in terms of the modulation of the tunnel barrier by the reactive Ti layer on top of the barrier.

Keywords

Cite

@article{arxiv.1102.4720,
  title  = {Pt/Ti/Al2O3/Al tunnel junctions showing electroforming-free bipolar resistive switching behavior},
  author = {Doo Seok Jeong and Byung-ki Cheong and Hermann Kohlstedt},
  journal= {arXiv preprint arXiv:1102.4720},
  year   = {2015}
}