On the analysis of island shape evolution from diffuse x-ray scattering of organic thin films and the implications for growth
Abstract
Understanding the growth of organic semi-conducting molecules with shape anisotropy is of high relevance to the processing of optoelectronic devices. This work provides insight into the growth of thin films of the prototypical rodlike organic semiconductor diindenoperylene on a microscopic level, by analyzing in detail the film morphology. We model our data, which were obtained by high-resolution grazing incidence small angle x-ray scattering (GISAXS), using a theoretical description from small angle scattering theory derived for simple liquids. Based on form factor calculations for different object types we determine how the island shapes change in the respective layers. Atomic force microscopy measurements approve our findings.
Keywords
Cite
@article{arxiv.1410.5727,
title = {On the analysis of island shape evolution from diffuse x-ray scattering of organic thin films and the implications for growth},
author = {C. Frank and R. Banerjee and M. Oettel and A. Gerlach and J. Novák and G. Santoro and F. Schreiber},
journal= {arXiv preprint arXiv:1410.5727},
year = {2015}
}
Comments
11 pages, 7 figures, accepted by Phys. Rev. B