Complementary metal-oxide semiconductor (CMOS) sensors have been widely used as soft X-ray detectors in several fields owing to their recent developments and unique advantages. The parameters of CMOS detectors have been extensively studied and evaluated. However, the key parameter signal-to-noise ratio in certain fields has not been sufficiently studied. In this study, we analysed the charge distribution of the CMOS detector GSENSE2020BSI and proposed a two-dimensional segmentation method to discriminate signals according to the charge distribution. The effect of the two-dimensional segmentation method on the GSENSE2020BSI dectector was qualitatively evaluated. The optimal feature parameters used in the two-dimensional segmentation method was studied for G2020BSI. However, the two-dimensional segmentation method is insensitive to feature parameters.
@article{arxiv.2311.07844,
title = {Noise discrimination method based on charge distribution of CMOS detectors for soft X-ray},
author = {Xinchao Fang and Jirong Cang and Qiong Wu and Hua Feng and Ming Zeng},
journal= {arXiv preprint arXiv:2311.07844},
year = {2023}
}