English

MgO barrier-perpendicular magnetic tunnel junctions with CoFe/Pd multilayers and ferromagnetic insertion layers

Materials Science 2015-05-14 v1

Abstract

The authors studied an effect of ferromagnetic (Co20Fe60B20 or Fe) layer insertion on tunnel magnetoresistance (TMR) properties of MgO-barrier magnetic tunnel junctions (MTJs) with CoFe/Pd multilayer electrodes. TMR ratio in MTJs with CoFeB/MgO/Fe stack reached 67% at an-nealing temperature (Ta) of 200 degree C and then decreased rapidly at Ta over 250 degree C. The degradation of the TMR ratio may be related to crystallization of CoFe(B) into fcc(111) or bcc(011) texture result-ing from diffusion of B into Pd layers. MTJs which were in-situ annealed at 350oC just after depo-siting bottom CoFe/Pd multilayer showed TMR ratio of 78% by post annealing at Ta =200 degree C.

Keywords

Cite

@article{arxiv.0910.4204,
  title  = {MgO barrier-perpendicular magnetic tunnel junctions with CoFe/Pd multilayers and ferromagnetic insertion layers},
  author = {K. Mizunuma and S. Ikeda and J. H. Park and H. Yamamoto and H. Gan and K. Miura and H. Hasegawa and J. Hayakawa and F. Matsukura and H. Ohno},
  journal= {arXiv preprint arXiv:0910.4204},
  year   = {2015}
}

Comments

12 pages, 4 figures