Lock-in detection for pulsed electrically detected magnetic resonance

Felix Hoehne; Lukas Dreher; Jan Behrends; Matthias Fehr; Hans Huebl; Klaus Lips; Alexander Schnegg; Max Suckert; Martin Stutzmann; Martin S. Brandt

doi:10.1063/1.4704837

Lock-in detection for pulsed electrically detected magnetic resonance

Materials Science 2015-06-03 v1 Mesoscale and Nanoscale Physics

Authors: Felix Hoehne , Lukas Dreher , Jan Behrends , Matthias Fehr , Hans Huebl , Klaus Lips , Alexander Schnegg , Max Suckert , Martin Stutzmann , Martin S. Brandt

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Abstract

We show that in pulsed electrically detected magnetic resonance (pEDMR) signal modulation in combination with a lock-in detection scheme can reduce the low-frequency noise level by one order of magnitude and in addition removes the microwave-induced non-resonant background. This is exemplarily demonstrated for spin-echo measurements in phosphorus-doped Silicon. The modulation of the signal is achieved by cycling the phase of the projection pulse used in pEDMR for the read-out of the spin state.

Keywords

pulsed electrically detected magnetic resonance lock-in detection low-frequency noise spin-echo phosphorus-doped silicon phase cycling

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@article{arxiv.1111.5149,
  title  = {Lock-in detection for pulsed electrically detected magnetic resonance},
  author = {Felix Hoehne and Lukas Dreher and Jan Behrends and Matthias Fehr and Hans Huebl and Klaus Lips and Alexander Schnegg and Max Suckert and Martin Stutzmann and Martin S. Brandt},
  journal= {arXiv preprint arXiv:1111.5149},
  year   = {2015}
}

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4 pages, 2 figures

Lock-in detection for pulsed electrically detected magnetic resonance

Abstract

Keywords

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