Investigation of quantum-dimensional structure parameters by X-ray optical, scanning tunneling and transmission electron microscopy

A. G. Touryanski; V. M. Senkov; S. S. Gizha; L. V. Arapkina; V. A. Chapnin; K. V. Chizh; V. P. Kalinushkin; M. S. Storozhevykh; O. V. Uvarov; V. A. Yuryev

Investigation of quantum-dimensional structure parameters by X-ray optical, scanning tunneling and transmission electron microscopy

Materials Science 2013-07-09 v1 Mesoscale and Nanoscale Physics Optics

Authors: A. G. Touryanski , V. M. Senkov , S. S. Gizha , L. V. Arapkina , V. A. Chapnin , K. V. Chizh , V. P. Kalinushkin , M. S. Storozhevykh , O. V. Uvarov , V. A. Yuryev

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Abstract

Application of the two-wavelength X-ray reflectometry to exploration of Ge/Si(001) hereostructures with dense chains of stacked Ge quantum dots is presented

Keywords

quantum dots X-ray reflectometry Ge/Si heterostructures scanning tunneling microscopy transmission electron microscopy quantum-dimensional structures

Cite

@article{arxiv.1304.0955,
  title  = {Investigation of quantum-dimensional structure parameters by X-ray optical, scanning tunneling and transmission electron microscopy},
  author = {A. G. Touryanski and V. M. Senkov and S. S. Gizha and L. V. Arapkina and V. A. Chapnin and K. V. Chizh and V. P. Kalinushkin and M. S. Storozhevykh and O. V. Uvarov and V. A. Yuryev},
  journal= {arXiv preprint arXiv:1304.0955},
  year   = {2013}
}

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21st Int. Symp. "Nanostructures: Physics and Technology"; Saint Petersburg, Russia, June 24-28, 2013

Investigation of quantum-dimensional structure parameters by X-ray optical, scanning tunneling and transmission electron microscopy

Abstract

Keywords

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