Generic Microstrip R&D Topics at SCIPP: Longitudinal Charge Division and Length Limitations for Long Strips

Jerome K. Carman; Vitaliy Fadeyev; Khilesh Mistry; Bruce A. Schumm; Edwin Spencer; Aaron Taylor; Max Wilder

Generic Microstrip R&D Topics at SCIPP: Longitudinal Charge Division and Length Limitations for Long Strips

Instrumentation and Detectors 2011-12-21 v1

Authors: Jerome K. Carman , Vitaliy Fadeyev , Khilesh Mistry , Bruce A. Schumm , Edwin Spencer , Aaron Taylor , Max Wilder

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Abstract

We discuss results on the use of charge division to estimate the longitudinal position of charge deposition in silicon microstrip sensors, and on the intrinsic noise limitation of microstrip sensors in the limit of long, narrow strips. We find a resolution of \pm6% of the length of the sensor for a 10cm-long sensor. We also find that network effects significantly reduce sensor readout noise relative to naive expectations that arise from treating the detector resistance and capacitance as single discrete electronic components.

Keywords

signal processing and noise analysis

Cite

@article{arxiv.1112.4823,
  title  = {Generic Microstrip R&D Topics at SCIPP: Longitudinal Charge Division and Length Limitations for Long Strips},
  author = {Jerome K. Carman and Vitaliy Fadeyev and Khilesh Mistry and Bruce A. Schumm and Edwin Spencer and Aaron Taylor and Max Wilder},
  journal= {arXiv preprint arXiv:1112.4823},
  year   = {2011}
}

Comments

4 pages, 2 figures, to appear in the proceedings of the LCWS11 2011 International Linear Collider Workshop

Generic Microstrip R&D Topics at SCIPP: Longitudinal Charge Division and Length Limitations for Long Strips

Abstract

Keywords

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