In this paper, we report high-precision absolute distance and vibration measurements performed with frequency scanned interferometry. Absolute distance was determined by counting the interference fringes produced while scanning the laser frequency. High-finesse Fabry-Perot interferometers were used to determine frequency changes during scanning. A dual-laser scanning technique was used to cancel drift errors to improve the absolute distance measurement precision. A new dual-channel FSI demonstration system is also presented which is an interim stage toward practical application of multi-channel distance measurement. Under realistic conditions, a precision of 0.3 microns was achieved for an absolute distance of 0.57 meters. A possible optical alignment system for a silicon tracker is also presented.
@article{arxiv.1109.2582,
title = {Frequency Scanned Interferometry for ILC Tracker Alignment},
author = {Hai-Jun Yang and Tianxiang Chen and Keith Riles},
journal= {arXiv preprint arXiv:1109.2582},
year = {2011}
}
Comments
8 pages, Proceedings for the DPF-2011 Conference, Providence, RI, August 8-13, 2011