In electric double layer transistors with SrTiO3 single crystals, we found distinct differences between electrostatic charge accumulation and electrochemical reaction depending on bias voltages. In contrast to the reversible electrostatic process below 3.7 V with a maximum sheet charge carrier density, nS, of 1014 cm-2, the electrochemical process causes persistent conduction even after removal of the gate bias above 3.75 V. nS reached 1015 cm-2 at 5 V, and the electron mobility at 2 K was as large as 104 cm2/Vs. This persistent conduction originates from defect formation within a few micrometers depth of SrTiO3.
@article{arxiv.1006.3847,
title = {Electrostatic charge accumulation versus electrochemical doping in SrTiO3 electric double layer transistors},
author = {Kazunori Ueno and Hidekazu Shimotani and Yoshihiro Iwasa and Masashi Kawasaki},
journal= {arXiv preprint arXiv:1006.3847},
year = {2010}
}
Comments
11 pages, 5 figures. Applied Physics Letters, in press