Electronic charge reconstruction of doped Mott insulators in multilayered nanostructures
Strongly Correlated Electrons
2009-11-11 v1
Abstract
Dynamical mean-field theory is employed to calculate the electronic charge reconstruction of multilayered inhomogeneous devices composed of semi-infinite metallic lead layers sandwiching barrier planes of a strongly correlated material (that can be tuned through the metal-insulator Mott transition). The main focus is on barriers that are doped Mott insulators, and how the electronic charge reconstruction can create well-defined Mott insulating regions in a device whose thickness is governed by intrinsic materials properties, and hence may be able to be reproducibly made.
Keywords
Cite
@article{arxiv.cond-mat/0612312,
title = {Electronic charge reconstruction of doped Mott insulators in multilayered nanostructures},
author = {Ling Chen and J. K. Freericks},
journal= {arXiv preprint arXiv:cond-mat/0612312},
year = {2009}
}
Comments
9 pages, 8 figures