Electrically-Detected ESR in Silicon Nanostructures Inserted in Microcavities

Nikolay Bagraev; Eduard Danilovskii; Wolfgang Gehlhoff; Dmitrii Gets; Leonid Klyachkin; Andrey Kudryavtsev; Roman Kuzmin; Anna Malyarenko; Vladimir Mashkov; Vladimir Romanov

doi:10.1063/1.4865648

Electrically-Detected ESR in Silicon Nanostructures Inserted in Microcavities

Mesoscale and Nanoscale Physics 2014-03-05 v1 Superconductivity

Authors: Nikolay Bagraev , Eduard Danilovskii , Wolfgang Gehlhoff , Dmitrii Gets , Leonid Klyachkin , Andrey Kudryavtsev , Roman Kuzmin , Anna Malyarenko , Vladimir Mashkov , Vladimir Romanov

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Abstract

We present the first findings of the new electrically-detected electron spin resonance technique (EDESR), which reveal the point defects in the ultra-narrow silicon quantum wells (Si-QW) confined by the superconductor delta-barriers. This technique allows the ESR identification without application of an external cavity, as well as a high frequency source and recorder, and with measuring the only response of the magnetoresistance, with internal GHz Josephson emission within frameworks of the normal-mode coupling (NMC) caused by the microcavities embedded in the Si-QW plane.

Keywords

magnetic resonance

Cite

@article{arxiv.1308.5082,
  title  = {Electrically-Detected ESR in Silicon Nanostructures Inserted in Microcavities},
  author = {Nikolay Bagraev and Eduard Danilovskii and Wolfgang Gehlhoff and Dmitrii Gets and Leonid Klyachkin and Andrey Kudryavtsev and Roman Kuzmin and Anna Malyarenko and Vladimir Mashkov and Vladimir Romanov},
  journal= {arXiv preprint arXiv:1308.5082},
  year   = {2014}
}

Electrically-Detected ESR in Silicon Nanostructures Inserted in Microcavities

Abstract

Keywords

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