Recent advances in the field of vertically stacked 2D materials have revealed a rich exciton landscape. In particular, it has been demonstrated that out-of-plane electrical fields can be used to tune the spectral position of spatially separated interlayer excitons. Other studies have shown that there is a strong hybridization of exciton states, resulting from the mixing of electronic states in both layers. However, the connection between the twist-angle dependent hybridization and field-induced energy shifts has remained in the dark. Here, we investigate on a microscopic footing the interplay of electrical and twist-angle tuning of moir\'e excitons in MoSe2 homobilayers. We reveal distinct energy regions in PL spectra that are clearly dominated by either intralayer or interlayer excitons, or even dark excitons. Consequently, we predict twist-angle-dependent critical electrical fields at which the material is being transformed from a direct into an indirect semiconductor. Our work provides new microscopic insights into experimentally accessible knobs to significantly tune the moir\'e exciton physics in atomically thin nanomaterials.
@article{arxiv.2207.01890,
title = {Electrical tuning of moir\'e excitons in MoSe$_2$ bilayers},
author = {Joakim Hagel and Samuel Brem and Ermin Malic},
journal= {arXiv preprint arXiv:2207.01890},
year = {2023}
}