Electrical transport across metal/two-dimensional carbon junctions: Edge versus side contacts
Mesoscale and Nanoscale Physics
2012-02-06 v1
Abstract
Metal/two-dimensional carbon junctions are characterized by using a nanoprobe in an ultrahigh vacuum environment. Significant differences were found in bias voltage (V) dependence of differential conductance (dI/dV) between edge- and side-contact; the former exhibits a clear linear relationship (i.e., dI/dV \propto V), whereas the latter is characterized by a nonlinear dependence, dI/dV \propto V3/2. Theoretical calculations confirm the experimental results, which are due to the robust two-dimensional nature of the carbon materials under study. Our work demonstrates the importance of contact geometry in graphene-based electronic devices.
Keywords
Cite
@article{arxiv.1202.0615,
title = {Electrical transport across metal/two-dimensional carbon junctions: Edge versus side contacts},
author = {Yihong Wu and Ying Wang and Jiayi Wang and Miao Zhou and Aihua Zhang and Chun Zhang and Yanjing Yang and Younan Hua and Baoxi Xu},
journal= {arXiv preprint arXiv:1202.0615},
year = {2012}
}