Curvature-adaptive gigapixel microscopy at submicron resolution and centimeter scale
Abstract
Large-area microscopy with submicron resolution is limited by tradeoffs between field of view (FOV), resolution, and imaging speed. Samples are rarely flat across centimeter-scale FOV, which often requires existing solutions to use mechanical scanning to ensure focused capture at reduced throughput. Here, we present PANORAMA, a single-shot, re-imaging microscope that achieves seamless, gigapixel imaging over a 16.318.8 FOV at 0.84 um resolution without mechanical scanning. By using a telecentric photolithography lens, a large-aperture tube lens, and a flat micro-camera array with adaptive per-camera focus control, PANORAMA maintains submicron focus across flat, curved or uneven samples that span centimeters. This approach improves imaging throughput and adaptability, enabling gigapixel multi-modal microscopy of large flat and non-flat samples in one shot, thus broadening its applications in biomedical and materials imaging.
Cite
@article{arxiv.2507.09697,
title = {Curvature-adaptive gigapixel microscopy at submicron resolution and centimeter scale},
author = {Xi Yang and Haitao Chen and Lucas Kreiss and Clare B. Cook and Genevieve Kuczewski and Mark Harfouche and Martin O. Bohlen and Roarke Horstmeyer},
journal= {arXiv preprint arXiv:2507.09697},
year = {2025}
}