X-ray Fourier ptychographic microscopy
Instrumentation and Detectors
2016-09-27 v1 Optics
Abstract
Following the recent developement of Fourier ptychographic microscopy (FPM) in the visible range by Zheng et al. (2013), we propose an adaptation for hard x-rays. FPM employs ptychographic reconstruction to merge a series of low-resolution, wide field of view images into a high-resolution image. In the x-ray range this opens the possibility to overcome the limited numerical aperture of existing x-ray lenses. Furthermore, digital wave front correction (DWC) may be used to charaterize and correct lens imperfections. Given the diffraction limit achievable with x-ray lenses (below 100 nm), x-ray Fourier ptychographic microscopy (XFPM) should be able to reach resolutions in the 10 nm range.
Cite
@article{arxiv.1609.07513,
title = {X-ray Fourier ptychographic microscopy},
author = {H. Simons and H. F. Poulsen and J. P. Guigay and C. Detlefs},
journal= {arXiv preprint arXiv:1609.07513},
year = {2016}
}
Comments
9 pages, 1 figure