Optical illumination of quantum-dot qubit devices at cryogenic temperatures, while not well studied, is often used to recover operating conditions after undesired shocking events or charge injection. Here, we demonstrate systematic threshold voltage shifts in a dopant-free, Si/SiGe field effect transistor using a near infrared (780 nm) laser diode. We find that illumination under an applied gate voltage can be used to set a specific, stable, and reproducible threshold voltage that, over a wide range in gate bias, is equal to that gate bias. Outside this range, the threshold voltage can still be tuned, although the resulting threshold voltage is no longer equal to the applied gate bias during illumination. We present a simple and intuitive model that provides a mechanism for the tunability in gate bias. The model presented also explains why cryogenic illumination is successful at resetting quantum dot qubit devices after undesired charging events.
@article{arxiv.2312.14011,
title = {Control of threshold voltages in Si/SiGe quantum devices via optical illumination},
author = {M. A. Wolfe and Brighton X. Coe and Justin S. Edwards and Tyler J. Kovach and Thomas McJunkin and Benjamin Harpt and D. E. Savage and M. G. Lagally and R. McDermott and Mark Friesen and Shimon Kolkowitz and M. A. Eriksson},
journal= {arXiv preprint arXiv:2312.14011},
year = {2026}
}