English

CdZnTe:Cl crystals for X-ray computer tomography detectors

Materials Science 2007-05-23 v1
Authors: O. A. Matveev , A. I. Terent'ev , V. P. Karpenko , N. K. Zelenina , A. Fauler , M. Federle , K. W. Benz
Journal reference: phys. stat. sol. (b) 229, No. 2, 1073-1076 (2002)
Comments: 3 pages, 2 figures
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Abstract

Processes of growth of semi-insulating Cd(1-x)Zn(x)Te:Cl crystals (x = 0.0002 and 0.1) of n-type conductivity are investigated. From the grown crystals detectors for X-ray computer tomography with small value of photocurrent memory (afterglow) (0.1-0.3%) are obtained.

Keywords

crystal growth

Cite

@article{arxiv.0704.2330,
  title  = {CdZnTe:Cl crystals for X-ray computer tomography detectors},
  author = {O. A. Matveev and A. I. Terent'ev and V. P. Karpenko and N. K. Zelenina and A. Fauler and M. Federle and K. W. Benz},
  journal= {arXiv preprint arXiv:0704.2330},
  year   = {2007}
}

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