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Bragg projection ptychography on niobium phase domain

Materials Science 2017-07-19 v2 Mesoscale and Nanoscale Physics
Authors: Nicolas Burdet , Xiaowen Shi , Jesse N. Clark , Xiaojing Huang , Ross Harder , I. K. Robinson
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Abstract

We demonstrate that the highly sensitive phase-contrast properties of Bragg coherent diffraction measurements combined with the translational diversity of ptychography can provide a Bragg "dark field" imaging method capable of revealing the finger print of domain structure in metallic thin films. Experimental diffraction data was taken from a epitaxially grown niobium metallic thin film on sapphire; and analysed with the help of a careful combination of implemented refinement mechanisms.

Keywords

diffraction gratings x-ray imaging and diffraction

Cite

@article{arxiv.1608.03098,
  title  = {Bragg projection ptychography on niobium phase domain},
  author = {Nicolas Burdet and Xiaowen Shi and Jesse N. Clark and Xiaojing Huang and Ross Harder and I. K. Robinson},
  journal= {arXiv preprint arXiv:1608.03098},
  year   = {2017}
}

Comments

Submitted on Aug, 8, 2016

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