Coherent diffraction imaging (CDI) on Bragg reflections is a promising technique for the study of three-dimensional (3D) composition and strain fields in nanostructures, which can be recovered directly from the coherent diffraction data recorded on single objects. In this article we report results obtained for single homogeneous and heterogeneous nanowires with a diameter smaller than 100 nm, for which we used CDI to retrieve information about deformation and faults existing in these wires. The article also discusses the influence of stacking faults, which can create artefacts during the reconstruction of the nanowire shape and deformation.
@article{arxiv.0910.5491,
title = {Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging},
author = {V. Favre-Nicolin and F. Mastropietro and J. Eymery and D. Camacho and Y. M. Niquet and B. M. Borg and M. E. Messing and L. -E. Wernersson and R. E. Algra and E. P. A. M. Bakkers and T. H. Metzger and R Harder and I. K. Robinson},
journal= {arXiv preprint arXiv:0910.5491},
year = {2010}
}
Comments
18 pages, 6 figures Submitted to New Journal of Physics