A Silicon Nitride Microring Modulator for High-Performance Photonic Integrated Circuits
Abstract
The use of the Silicon-on-Insulator (SOI) platform has been prominent for realizing CMOS-compatible, high-performance photonic integrated circuits (PICs). But in recent years, the silicon-nitride-on-silicon-dioxide (SiN-on-SiO) platform has garnered increasing interest as an alternative, because of its several beneficial properties over the SOI platform, such as low optical losses, high thermo-optic stability, broader wavelength transparency range, and high tolerance to fabrication-process variations. However, SiN-on-SiO based active devices, such as modulators, are scarce and lack in desired performance due to the absence of free-carrier-based activity in the SiN material and the complexity of integrating other active materials with SiN-on-SiO platform. This shortcoming hinders the SiN-on-SiO platform for realizing active PICs. To address this shortcoming, in this article, we demonstrate a SiN-on-SiO microring resonator (MRR) based active modulator. Our designed MRR modulator employs an Indium-Tin-Oxide (ITO)-SiO-ITO thin-film stack as the active upper cladding and leverages the free-carrier assisted, high-amplitude refractive index change in the ITO films to affect a large electro-refractive optical modulation in the device. Based on the electrostatic, transient, and finite difference time domain (FDTD) simulations, conducted using photonics foundry-validated tools, we show that our modulator achieves 450 pm/V resonance modulation efficiency, 46.2 GHz 3-dB modulation bandwidth, 18 nm free-spectral range (FSR), 0.24 dB insertion loss, and 8.2 dB extinction ratio for optical on-off-keying (OOK) modulation at 30 Gb/s.
Keywords
Cite
@article{arxiv.2306.07238,
title = {A Silicon Nitride Microring Modulator for High-Performance Photonic Integrated Circuits},
author = {Venkata Sai Praneeth Karempudi and Ishan G Thakkar and Jeffrey Todd Hastings},
journal= {arXiv preprint arXiv:2306.07238},
year = {2023}
}
Comments
arXiv admin note: substantial text overlap with arXiv:2212.06326