A capacitive displacement system was constructed to measure the electric-field-induced piezoelectric strain in the simple form of either a bulk or thin film. The system can determine an AC displacement of 2 pm precisely by using a lock-in detection, and can measure the large displacement within a range of ± 25 μm with a sub-nanometer resolution. The system can also be used to measure the variation in strain within a temperature range of 210 - 450 K, allowing the evaluation of the temperature coefficient of a piezoelectric constant and the studies on the effects of a phase transition on the piezoelectric response. Experimental results on quartz, PZT ceramics and thin films, and BaTiO3 confirm the capabilities of the developed system.
@article{arxiv.2104.02211,
title = {A capacitive displacement system for studying the piezoelectric strain and its temperature variation},
author = {Desheng Fu and Eiki Kakihara},
journal= {arXiv preprint arXiv:2104.02211},
year = {2021}
}