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Using Perturbation to Improve Goodness-of-Fit Tests based on Kernelized Stein Discrepancy

Machine Learning 2023-06-06 v3 Machine Learning Methodology

Abstract

Kernelized Stein discrepancy (KSD) is a score-based discrepancy widely used in goodness-of-fit tests. It can be applied even when the target distribution has an unknown normalising factor, such as in Bayesian analysis. We show theoretically and empirically that the KSD test can suffer from low power when the target and the alternative distributions have the same well-separated modes but differ in mixing proportions. We propose to perturb the observed sample via Markov transition kernels, with respect to which the target distribution is invariant. This allows us to then employ the KSD test on the perturbed sample. We provide numerical evidence that with suitably chosen transition kernels the proposed approach can lead to substantially higher power than the KSD test.

Keywords

Cite

@article{arxiv.2304.14762,
  title  = {Using Perturbation to Improve Goodness-of-Fit Tests based on Kernelized Stein Discrepancy},
  author = {Xing Liu and Andrew B. Duncan and Axel Gandy},
  journal= {arXiv preprint arXiv:2304.14762},
  year   = {2023}
}

Comments

To appear at International Conference on Machine Learning (ICML) 2023. 21 pages, 8 figures

R2 v1 2026-06-28T10:20:37.816Z