English

A kernel Stein test of goodness of fit for sequential models

Machine Learning 2023-07-14 v3 Machine Learning Computation

Abstract

We propose a goodness-of-fit measure for probability densities modeling observations with varying dimensionality, such as text documents of differing lengths or variable-length sequences. The proposed measure is an instance of the kernel Stein discrepancy (KSD), which has been used to construct goodness-of-fit tests for unnormalized densities. The KSD is defined by its Stein operator: current operators used in testing apply to fixed-dimensional spaces. As our main contribution, we extend the KSD to the variable-dimension setting by identifying appropriate Stein operators, and propose a novel KSD goodness-of-fit test. As with the previous variants, the proposed KSD does not require the density to be normalized, allowing the evaluation of a large class of models. Our test is shown to perform well in practice on discrete sequential data benchmarks.

Keywords

Cite

@article{arxiv.2210.10741,
  title  = {A kernel Stein test of goodness of fit for sequential models},
  author = {Jerome Baum and Heishiro Kanagawa and Arthur Gretton},
  journal= {arXiv preprint arXiv:2210.10741},
  year   = {2023}
}

Comments

18 pages. Accepted to ICML 2023