Swept bias experiments carried out on Josephson junctions yield the distributions of the probabilities of early switching from the zero voltage state. Kramers' theory of thermally activated escape from a one-dimensional potential is well known to fall short of explaining such experiments when the junctions are at millikelvin temperatures. We propose a simple revision of the theory which is shown to yield extremely good agreement with experimental data.
@article{arxiv.1409.0066,
title = {Switching Current Distributions in Josephson Junctions at Very Low Temperatures},
author = {James A. Blackburn and Matteo Cirillo and Niels Grønbech-Jensen},
journal= {arXiv preprint arXiv:1409.0066},
year = {2014}
}