Flatbed scanners have emerged as promising devices for high-resolution, single-image material capture. However, existing approaches assume very specific conditions, such as uniform diffuse illumination, which are only available in certain high-end devices, hindering their scalability and cost. In contrast, in this work, we introduce a method inspired by intrinsic image decomposition, which accurately removes both shading and specularity, effectively allowing captures with any flatbed scanner. Further, we extend previous work on single-image material reflectance capture with the estimation of opacity and transmittance, critical components of full material appearance (SVBSDF), improving the results for any material captured with a flatbed scanner, at a very high resolution and accuracy
@article{arxiv.2502.14462,
title = {Single-image Reflectance and Transmittance Estimation from Any Flatbed Scanner},
author = {Carlos Rodriguez-Pardo and David Pascual-Hernandez and Javier Rodriguez-Vazquez and Jorge Lopez-Moreno and Elena Garces},
journal= {arXiv preprint arXiv:2502.14462},
year = {2025}
}