Simulation of X-ray diffraction profiles for bent anisotropic crystals
Materials Science
2015-03-13 v2 Optics
Abstract
The equations for calculating diffraction profiles for bent crystals are revisited for both meridional and sagittal bending. Two approximated methods for computing diffraction profiles are treated: multilamellar and Penning-Polder. A common treatment of crystal anisotropy is included in these models. The formulation presented is implemented into the XOP package, completing and updating the crystal module that simulates diffraction profiles for perfect, mosaic and now distorted crystals by elastic bending.
Cite
@article{arxiv.1502.03059,
title = {Simulation of X-ray diffraction profiles for bent anisotropic crystals},
author = {Manuel Sanchez del Rio and Nicolas Perez-Bocanegra and Xianbo Shi and Veijo Honkimaki and Lin Zhang},
journal= {arXiv preprint arXiv:1502.03059},
year = {2015}
}
Comments
16 pages, 14 figures Version 2: reduced size of Fig. 14 (it was overlapping the text), improve bib format, some other minor fixes