We report on a comparison of four GaAs/AlGaAs-based quantum resistance standards using an original technique adapted from the well-known Wheatstone bridge. This work shows that the quantized Hall resistance at Landau level filling factor ν=2 can be reproducible with a relative uncertainty of 32×10−12 in the dissipationless limit of the quantum Hall effect regime. In the presence of a very small dissipation characterized by a mean macroscopic longitudinal resistivity Rxx(B)ˉ of a few μΩ, the discrepancy ΔRH(B) measured on the Hall plateau between quantum Hall resistors turns out to follow the so-called resistivity rule Rxx(B)ˉ=αB×d(ΔRH(B))/dB. While the dissipation increases with the measurement current value, the coefficient α stays constant in the range investigated (40−120μA). This result enlightens the impact of the dissipation emergence in the two-dimensional electron gas on the Hall resistance quantization, which is of major interest for the resistance metrology. The quantum Hall effect is used to realize a universal resistance standard only linked to the electron charge \emph{e} and the Planck's constant \emph{h} and it is known to play a central role in the upcoming revised \emph{Syst\`eme International} of units. There are therefore fundamental and practical benefits in testing the reproducibility property of the quantum Hall effect with better and better accuracy.
@article{arxiv.1301.5241,
title = {Quantum resistance standard accuracy close to the zero-dissipation state},
author = {Félicien Schopfer and Wilfrid Poirier},
journal= {arXiv preprint arXiv:1301.5241},
year = {2013}
}