Optical microscope with nanometer longitudinal resolution based on a Linnik interferometer
Optics
2024-06-25 v2
Abstract
A microscope based on the Linnik interferometer was designed, built, and tested. Two methods were used for interference pattern measurement: phase-shifting and polarized single-shot methods. The former uses a low coherence light emitting diode as a light source, providing 10 nm resolution in the Z direction and diffraction-limited resolution in the X and Y directions. The second method is insensitive to vibrations and enables observation of moving objects. The simplicity and low cost of this instrument make it valuable for a variety of applications.
Cite
@article{arxiv.2406.08403,
title = {Optical microscope with nanometer longitudinal resolution based on a Linnik interferometer},
author = {Sergei V. Anishchik and Marcos Dantus},
journal= {arXiv preprint arXiv:2406.08403},
year = {2024}
}
Comments
17 pages, 6 figures