Metric Multiview Geometry -- a Catalogue in Low Dimensions
Abstract
We systematically compile an exhaustive catalogue of multiview varieties and anchored multiview varieties arising from projections of points and lines in 1, 2, and 3-dimensional projective space. We say that two such varieties are ED-equivalent if there is a linear isomorphism between that that preserve ED-critical points. This gives rise to fourteen equivalence classes, and we determine various properties - dimension, set-theoretic equations, and multidegrees - for all varieties featured in our catalogue. In the case of points, we also present a complementary study of resectioning varieties and their singular loci. Finally, we propose conjectures for the Euclidean distance degrees of all varieties appearing in our comprehensive compilation.
Cite
@article{arxiv.2402.00648,
title = {Metric Multiview Geometry -- a Catalogue in Low Dimensions},
author = {Timothy Duff and Felix Rydell},
journal= {arXiv preprint arXiv:2402.00648},
year = {2024}
}