We performed measurements of switching current distribution in a submicron La2−xSrxCuO4 (LSCO) intrinsic Josephson junction (IJJ) stack in a wide temperature range. The escape rate saturates below approximately 2\,K, indicating that the escape event is dominated by a macroscopic quantum tunneling (MQT) process with a crossover temperature T∗≈2K. We applied the theory of MQT for IJJ stacks, taking into account dissipation and the phase re-trapping effect in the LSCO IJJ stack. The theory is in good agreement with the experiment both in the MQT and in the thermal activation regimes.
Cite
@article{arxiv.1201.0104,
title = {Macroscopic quantum tunneling and phase diffusion in a La$_{2-x}$Sr$_x$CuO$_4$ intrinsic Josephson junction stack},
author = {Yuimaru Kubo and A. O. Sboychakov and Franco Nori and Y. Takahide and S. Ueda and I. Tanaka and A. T. M. N. Islam and Y. Takano},
journal= {arXiv preprint arXiv:1201.0104},
year = {2015}
}