English

Diffractive shear interferometry for extreme ultraviolet high-resolution lensless imaging

Optics 2018-05-23 v2

Abstract

We demonstrate a novel imaging approach and associated reconstruction algorithm for far-field coherent diffractive imaging, based on the measurement of a pair of laterally sheared diffraction patterns. The differential phase profile retrieved from such a measurement leads to improved reconstruction accuracy, increased robustness against noise, and faster convergence compared to traditional coherent diffractive imaging methods. We measure laterally sheared diffraction patterns using Fourier-transform spectroscopy with two phase-locked pulse pairs from a high harmonic source. Using this approach, we demonstrate spectrally resolved imaging at extreme ultraviolet wavelengths between 28 and 35 nm.

Keywords

Cite

@article{arxiv.1802.07630,
  title  = {Diffractive shear interferometry for extreme ultraviolet high-resolution lensless imaging},
  author = {G. S. M. Jansen and A. C. C. de Beurs and X. Liu and K. S. E. Eikema and S. Witte},
  journal= {arXiv preprint arXiv:1802.07630},
  year   = {2018}
}
R2 v1 2026-06-23T00:28:58.458Z