The process of differential deposition is currently applied at the ESRF in order to correct figure errors of x-ray optics substrates, prior to multilayer deposition. The substrate is moved at a controlled speed in front of a sputtering source to precisely control the deposition profile. This work will describe the concept of differential deposition at the ESRF as well as recent results of its implementation to correct a real mirror substrate surface. Finally, initial studies using a synchrotron beamline characterization technique based on x-ray total reflection are presented.
@article{arxiv.2312.01778,
title = {Differential deposition applied to x-ray mirror substrate},
author = {Patrice Bras and Sylvain Labouré and Amparo Vivo and François Perrin and Christian Morawe},
journal= {arXiv preprint arXiv:2312.01778},
year = {2023}
}