English

An open-source, end-to-end workflow for multidimensional photoemission spectroscopy

Data Analysis, Statistics and Probability 2020-12-18 v3 Materials Science

Abstract

Characterization of the electronic band structure of solid state materials is routinely performed using photoemission spectroscopy. Recent advancements in short-wavelength light sources and electron detectors give rise to multidimensional photoemission spectroscopy, allowing parallel measurements of the electron spectral function simultaneously in energy, two momentum components and additional physical parameters with single-event detection capability. Efficient processing of the photoelectron event streams at a rate of up to tens of megabytes per second will enable rapid band mapping for materials characterization. We describe an open-source workflow that allows user interaction with billion-count single-electron events in photoemission band mapping experiments, compatible with beamlines at 3rd3^{\text{rd}} and 4th4^{\text{th}} generation light sources and table-top laser-based setups. The workflow offers an end-to-end recipe from distributed operations on single-event data to structured formats for downstream scientific tasks and storage to materials science database integration. Both the workflow and processed data can be archived for reuse, providing the infrastructure for documenting the provenance and lineage of photoemission data for future high-throughput experiments.

Keywords

Cite

@article{arxiv.1909.07714,
  title  = {An open-source, end-to-end workflow for multidimensional photoemission spectroscopy},
  author = {Rui Patrick Xian and Yves Acremann and Steinn Ymir Agustsson and Maciej Dendzik and Kevin Bühlmann and Davide Curcio and Dmytro Kutnyakhov and Frederico Pressacco and Michael Heber and Shuo Dong and Tommaso Pincelli and Jure Demsar and Wilfried Wurth and Philip Hofmann and Martin Wolf and Markus Scheidgen and Laurenz Rettig and Ralph Ernstorfer},
  journal= {arXiv preprint arXiv:1909.07714},
  year   = {2020}
}
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