English

A Note on Polynomial Identity Testing for Depth-3 Circuits

Computational Complexity 2018-05-22 v2

Abstract

Let CC be a depth-3 arithmetic circuit of size at most ss, computing a polynomial fF[x1,,xn] f \in \mathbb{F}[x_1,\ldots, x_n] (where F\mathbb{F} = Q\mathbb{Q} or C\mathbb{C}) and the fan-in of the product gates of CC is bounded by dd. We give a deterministic polynomial identity testing algorithm to check whether f0f\equiv 0 or not in time 2d poly(n,s) 2^d \text{ poly}(n,s) .

Cite

@article{arxiv.1805.06692,
  title  = {A Note on Polynomial Identity Testing for Depth-3 Circuits},
  author = {V. Arvind and Abhranil Chatterjee and Rajit Datta and Partha Mukhopadhyay},
  journal= {arXiv preprint arXiv:1805.06692},
  year   = {2018}
}

Comments

Result for finite fields has been added

R2 v1 2026-06-23T01:58:33.036Z