English

Black-box Identity Testing for Low Degree Unmixed $\Sigma\Pi\Sigma\Pi(k)$ Circuits

Computational Complexity 2012-07-26 v1 Rings and Algebras

Abstract

A ΣΠΣΠ(k)\Sigma\Pi\Sigma\Pi(k) circuit C=i=1kFi=i=1kj=1difijC=\sum_{i=1}^kF_i=\sum_{i=1}^k\prod_{j=1}^{d_i}f_{ij} is unmixed if for each i[k]i\in[k], Fi=fi1(x1)...fin(xn)F_i=f_{i1}(x_1)... f_{in}(x_n), where each fijf_{ij} is a univariate polynomial given in the sparse representation. In this paper, we give a polynomial time black-box algorithm of identity testing for the low degree unmixed ΣΠΣΠ(k)\Sigma\Pi\Sigma\Pi(k) circuits. In order to obtain the black-box algorithm, we first show that a special class of low degree unmixed ΣΠΣΠ(k)\Sigma\Pi\Sigma\Pi(k) circuits of size ss is sO(k2)s^{O(k^2)}-sparse. Then we construct a hitting set H\mathcal{H} in polynomial time for the low degree unmixed ΣΠΣΠ(k)\Sigma\Pi\Sigma\Pi(k) circuits from the sparsity result above. The constructed hitting set is polynomial size. Thus we can test whether the circuit or the polynomial CC is identically zero by checking whether C(a)=0C(a)=0 for each aHa\in\mathcal{H}. This is the first polynomial time black-box algorithm for the low degree unmixed ΣΠΣΠ(k)\Sigma\Pi\Sigma\Pi(k) circuits, which also partly answers a question of Saxena \cite{SAX}.

Keywords

Cite

@article{arxiv.1207.5884,
  title  = {Black-box Identity Testing for Low Degree Unmixed $\Sigma\Pi\Sigma\Pi(k)$ Circuits},
  author = {Jinyu Huang},
  journal= {arXiv preprint arXiv:1207.5884},
  year   = {2012}
}