\textit{Topmetal-II−} is a low noise CMOS pixel direct charge sensor with a pitch of 83μm. CdZnTe is an excellent semiconductor material for radiation detection. The combination of CdZnTe and the sensor makes it possible to build a detector with high spatial resolution. In our experiments, an epoxy adhesive is used as the conductive medium to connect the sensor and Cadmium Zinc Telluride (CdZnTe). The diffusion coefficient and charge efficiency of electrons are measured at a low bias voltage of -2 Volts, and the image of a single alpha is clear with a reasonable spatial resolution. The detector of such structure has the potential to be applied in X-ray imaging systems with a further improvements of the sensor.
@article{arxiv.1611.04142,
title = {A highly pixelated CdZnTe detector based on \textit{Topmetal-${II}^-$} sensor},
author = {Shuguang Zou and Yan Fan and Xiangming Sun and Guangming Huang and Hua Pei and Zhen Wang and Jun Liu and Ping Yang and Dong Wang},
journal= {arXiv preprint arXiv:1611.04142},
year = {2017}
}