Related papers: Single-Spin Measurement and Decoherence in Magneti…
Magnetic force microscopy (MFM) allows one to image the domain structure of ferromagnetic samples by probing the dipole forces between a magnetic probe tip and a magnetic sample. The magnetic domain structure of the sample depends on the…
Measurements of the deflection induced by thermal noise have been performed on a rectangular atomic force microscope cantilever in air. The detection method, based on polarization interferometry, can achieve a resolution of 1E-14 m/rtHz in…
Atomic Force Microscopy (AFM) methods utilizing resonant mechanical vibrations of cantilevers in contact with a sample surface have shown sensitivities as high as few picometers for detecting surface displacements. Such a high sensitivity…
We analyze the back-action influence of nuclear spins on the motion of the cantilever of a magnetic force resonance microscope. We calculate the contribution of nuclear spins to the damping and frequency shift of the cantilever. We show…
Frequency dependent dynamic behavior in Piezoresponse Force Microscopy (PFM) implemented on a beam-deflection atomic force microscope (AFM) is analyzed using a combination of modeling and experimental measurements. The PFM signal comprises…
The theory of angular momentum connects physical rotations and quantum spins together at a fundamental level. Physical rotation of a quantum system will therefore affect fundamental quantum operations, such as spin rotations in projective…
We report a combined study of imaging the antiferromagnetic (AFM) spin structure and measuring the spin Hall magnetoresistance (SMR) in epitaxial thin films of the insulating non-collinear antiferromagnet SmFeO$_3$. X-ray magnetic linear…
We present a novel method to image spin properties of spintronic systems using the spatially confined field of a scanned micromagnetic probe, in conjunction with existing electrical or optical global spin detection schemes. It is thus…
We propose to use optical detection of magnetic resonance (ODMR) to measure the decoherence time T_{2} of a single electron spin in a semiconductor quantum dot. The electron is in one of the spin 1/2 states and a circularly polarized laser…
The functionalization of an Atomic Force Microscope (AFM) cantilever with a colloidal bead is a widely used technique when the geometry between the probe and the sample must be controlled, particularly in force spectroscopy. But some…
Mechanical resonators operating in the megahertz range have become a versatile platform for fundamental and applied quantum research. Their exceptional properties, such as low mass and high quality factor, make them also appealing for force…
We propose a method for detecting the presence of a single spin in a crystal by coupling it to a high-quality factor superconducting planar resonator. By confining the microwave field in a constriction of nanometric dimensions, the coupling…
Single spin detection is one of the important tasks in the field of quantum metrology. Many experiments about the single spin detection has been performed. However, due to the weak magnetic fields from the single spin, a long measurement…
A spreadsheet algorithm is given for the atomic force microscope that accounts for non-linear behavior in the deflection of the cantilever and in the photo-diode response. In addition, the data analysis algorithm takes into account…
We have developed the experimental approach to characterize spatial distribution of the magnetic field produced by cantilever tips used in magnetic resonance force microscopy (MRFM). We performed MRFM measurements on a well characterized…
We investigate the capillary force that applies on a tilted cylinder as a function of its dipping angle i, using a home-built tilting Atomic Force Microscope (AFM) with custom made probes. A micrometric-size rod is glued at the end of an…
Moir\'e physics plays an important role for the characterization of functional materials and the engineering of physical properties in general, ranging from strain-driven transport phenomena to superconductivity. Here, we report the…
Amplitude-modulation atomic force microscopy (AM-AFM) measures nanoscale surface structures by detecting changes in the cantilever oscillation amplitude, contributing to materials research. AM-AFM can non-destructively observe fragile…
A mechanical electroscope based on a change in the resonant frequency of a cantilever one micron in size in the presence of charge has recently been fabricated. We derive the decoherence rate of a charge superposition during measurement…
Atomically-resolved imaging and force measurements using the atomic force microscope (AFM) are performed most commonly in a frequency-modulation (FM) mode. This has led to spectacular results, including direct observation of the atomic…