Single-Electron Measurements with a Micromechanical Resonator
Condensed Matter
2009-11-07 v1
Abstract
A mechanical electroscope based on a change in the resonant frequency of a cantilever one micron in size in the presence of charge has recently been fabricated. We derive the decoherence rate of a charge superposition during measurement with such a device using a master equation theory adapted from quantum optics. We also investigate the information produced by such a measurement, using a quantum trajectory approach. Such instruments could be used in mesoscopic electronic systems, and future solid-state quantum computers, so it is useful to know how they behave when used to measure quantum superpositions of charge.
Cite
@article{arxiv.cond-mat/0110302,
title = {Single-Electron Measurements with a Micromechanical Resonator},
author = {R. E. S. Polkinghorne and G. J. Milburn},
journal= {arXiv preprint arXiv:cond-mat/0110302},
year = {2009}
}
Comments
13 pages, 4 figures, RevTeX4