Related papers: Inversion of the Diffraction Pattern from an Inhom…
We investigate the retrieval of spatially resolved atomic displacements via the phases of the direct(real)-space image reconstructed from the strained crystal's coherent x-ray diffraction pattern. We demonstrate that limiting the spatial…
An algorithm for determining crystal structures from diffraction data is described which does not rely on the usual Fourier-space formulations of atomicity. The new algorithm implements atomicity constraints in real-space, as well as…
While the implementation of single particle coherent diffraction imaging for non-crystalline particles is complicated by current limitations in photon flux, hit rate, and sample delivery a concept of many-particle coherent diffraction…
Electron diffraction through a thin patterned silicon membrane can be used to create complex spatial modulations in electron distributions by varying the intensity of different reflections using parameters such as crystallographic…
Multi-technique high resolution X-ray mapping enhanced by the recent advent of 4th generation synchrotron facilities can produce colossal datasets, challenging traditional analysis methods. Such difficulty is clearly materialized when…
Iterative phase retrieval algorithms typically employ projections onto constraint subspaces to recover the unknown phases in the Fourier transform of an image, or, in the case of x-ray crystallography, the electron density of a molecule.…
Three-dimensional phase contrast imaging of multiply-scattering samples in X-ray and electron microscopy is extremely challenging, due to small numerical apertures, the unavailability of wavefront shaping optics, and the highly nonlinear…
Orientation mapping is a widely used technique for revealing the microstructure of a polycrystalline sample. The crystalline orientation at each point in the sample is determined by analysis of the diffraction pattern, a process known as…
Diffraction-based methods have become an invaluable tool for the detailed assessment of residual strain and stress within experimental mechanics. These methods typically measure a component of the average strain within a gauge volume. It is…
Crystalline materials used in technological applications are often complex assemblies composed of multiple phases and differently oriented grains. Robust identification of the phases and orientation relationships from these samples is…
It is demonstrated that an object distribution can be successfully retrieved from its diffraction pattern or hologram, even if some of the measured intensity samples are missing. The maximum allowable number of missing values depends on the…
A method for estimating the relative content of crystalline phases of a multiphase sample, based on probabilistic analysis of the intensities of the diffraction pattern reflexes, has been developed. The method is based on the introduction…
In coherent X-ray diffraction microscopy the diffraction pattern generated by a sample illuminated with coherent x-rays is recorded, and a computer algorithm recovers the unmeasured phases to synthesize an image. By avoiding the use of a…
In this paper, we develop a novel phase retrieval approach to reconstruct x-ray differential phase shift induced by an object. A primary advantage of our approach is a higher-order accuracy over that with the conventional linear…
Signal recovery from nonlinear measurements involves solving an iterative optimization problem. In this paper, we present a framework to optimize the sensing parameters to improve the quality of the signal recovered by the given iterative…
One of the most prominent challenges in the field of diffractive imaging is the phase retrieval (PR) problem: In order to reconstruct an object from its diffraction pattern, the inverse Fourier transform must be computed. This is only…
This paper considers the question of recovering the phase of an object from intensity-only measurements, a problem which naturally appears in X-ray crystallography and related disciplines. We study a physically realistic setup where one can…
We address an unusual problem in the theory of elasticity motivated by the problem of reconstructing the strain field from partial information obtained using X-ray diffraction. Referred to as either high-energy X-ray diffraction…
This paper is devoted to the inverse design of strained graphene surfaces for the control of electrons in the semi-classical optical-like regime. Assuming that charge carriers are described by the Dirac equation in curved-space and…
Solving crystal structures from kinematical X-ray or electron diffraction patterns of single crystals requires many more diffracted beams to be recorded than there are atoms in the structure, since the phases of the structure factors can…