Related papers: Simultaneous current-, force- and work function me…
Atomic scale friction, an indispensable element of nanotechnology, requires a direct access to, under actual growing shear stress, its successive live phases: from static pinning, to depinning and transient evolution, eventually ushering in…
In atomic force microscopy (AFM), the angle relative to the vertical ($\theta_{i}$) that the tip apex of a cantilever moves is determined by the tilt of the probe holder and the geometries of the cantilever and actuated eigenmode $i$. Even…
The optoelectronic properties of nanoscale systems such as carbon nanotubes (CNTs), graphene nanoribbons and transition metal dichalcogenides (TMDCs) are determined by their dielectric function. This complex, frequency dependent function is…
In the current work we present the complete results for the measurement of normal Casimir force between shallow and smooth sinusoidally corrugated gold coated sphere and a plate at various angles between the corrugations using an atomic…
We demonstrate thermally limited force spectroscopy using a probe formed by a dielectric microsphere optically trapped in water near a dielectric surface. We achieve force resolution below 1 fN in 100 s, corresponding to a 2 {\AA} rms…
We have developed a real-time beam current density meter for charged particle beams. It measures the mean current density by collimating a uniform and large diameter primary beam. The suppression of the secondary electrons and the…
In this article, we measure the viscous damping $G'',$ and the associated stiffness $G',$ of a liquid flow in sphere-plane geometry in a large frequency range. In this regime, the lubrication approximation is expected to dominate. We first…
We present here a powerful method providing simultaneous atomic spatial and nanosecond temporal resolution for investigating dynamics and structure on the atomic scale, in general. We reveal the dynamic reorganization of surface (ad)atoms…
Amplitude-modulation atomic force microscopy (AM-AFM) measures nanoscale surface structures by detecting changes in the cantilever oscillation amplitude, contributing to materials research. AM-AFM can non-destructively observe fragile…
This paper is a theoretical and a numerical investigation of the stability of a tip-cantilever system used in Non-Contact Atomic Force Microscopy (NC-AFM) when it oscillates close to a surface. No additional dissipative force is considered.…
We propose an interferometric setting for the ancilla-assisted measurement of the characteristic function of the work distribution following a time-dependent process experienced by a quantum system. We identify how the configuration of the…
Tapping mode atomic force microscopy is a standard technique for inspection and analysis at the nanometer scale. The understanding of the non-linear dynamics of the system due to the tip sample interaction is an important prerequisite for a…
We measure interaction forces between pairs of charged PMMA colloidal particles suspended in a relatively low-polar medium (5 $\lesssim \epsilon \lesssim$ 8) directly from the deviations of particle positions inside two time-shared optical…
Experiments performed by friction force microscopy at atomic-scale surface steps on graphite, MoS$_2$, and NaCl in ambient conditions are presented. Both step-down and step-up scans exhibit higher frictional forces at the edge, but…
A multiple-tip ultra-high vacuum (UHV) scanning tunneling microscope (MT-STM) with a scanning electron microscope (SEM) for imaging and molecular-beam epitaxy growth capabilities has been developed. This instrument (nanoworkbench) is used…
Atomic force microscopes (AFMs) are ubiquitous in research laboratories and have recently been priced for use in teaching laboratories. Here we review several AFM platforms (Dimension 3000 by Digital Instruments, EasyScan2 by Nanosurf,…
Estimating the contact state between a grasped tool and the environment is essential for performing contact tasks such as assembly and object manipulation. Force signals are valuable for estimating the contact state, as they can be utilized…
Electronic structure codes usually allow to calculate the work function as a part of the theoretical description of surfaces and processes such as adsorption thereon. This requires a proper calculation of the electrostatic potential in all…
We report on progress in developing compact sensors for atomic force microscopy (AFM), in which the mechanical transducer is integrated with near-field optical readout on a single chip. The motion of a nanoscale, doubly-clamped cantilever…
Correlation functions measured as a function of $\Delta \eta, \Delta \phi$ have emerged as a powerful tool to study the dynamics of particle production in nuclear collisions at high energy. They are however subject, like any other…