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Atomic-scale characteristics of surfaces dictate the principles governing numerous scientific phenomena ranging from catalysis to friction. Despite this fact, our ability to visualize and alter surfaces on the atomic scale is severely…

Applied Physics · Physics 2021-10-06 Saima A. Sumaiya , Mehmet Z. Baykara

Scanning tunneling microscope (STM) is a powerful tool for studying the structural and electronic properties of materials at the atomic scale. The combination of low temperature and high magnetic field for STM and related spectroscopy…

Materials Science · Physics 2018-11-13 Syu-You Guan , Hsien-Shun Liao , Bo-Jing Juang , Shu-Cheng Chin , Tien-Ming Chuang , Chia-Seng Chang

The Transient Fluctuation Theorem is used to calibrate an Atomic Force Microscope by measuring the fluctuations of the work performed by a time dependent force applied between a collo{\"i}dal probe and the surface. From this measure one can…

Mesoscale and Nanoscale Physics · Physics 2020-12-02 Samuel Albert , Aubin Archambault , Artyom Petrosyan , Caroline Crauste-Thibierge , Ludovic Bellon , Sergio Ciliberto

Electric Scanning Probe Microscopies are used to characterize the surface behavior of ferroelectric materials. The effects of local charge density on the chemistry and physics of ferroelectric surfaces are investigated. The kinetics and…

Materials Science · Physics 2007-05-23 Sergei V. Kalinin , Dawn A. Bonnell

Atomic force microscopy (AFM) is a powerful tool to investigate interaction forces at the micro and nanoscale. Cantilever stiffness, dimensions and geometry of the tip can be chosen according to the requirements of the specific application,…

Applied Physics · Physics 2020-07-31 M. Chighizola , L. Puricelli , L. Bellon , A. Podestà

Tuning forks are very popular experimental tools widely applied in low and ultra low temperature physics as mechanical resonators and cantilevers in the study of quantum liquids, STM and AFM techniques, etc. As an added benefit, these forks…

Materials Science · Physics 2015-06-22 M. Clovecko , M. Kupka , P. Skyba , F. Vavrek

Atomic force spectroscopy and microscopy (AFM) are invaluable tools to characterize nanostructures and biological systems. Most experiments, including state-of-the-art images of molecular bonds, are achieved by driving probes at their…

Atomic force microscopy (AFM) is one of the most promising methods for investigating the structure of materials at the micro and nanoscale levels, as well as their local physical-mechanical properties. The experimental data obtained with…

Materials Science · Physics 2018-05-07 Oleg K. Garishin , Roman I. Izyumov , Alexander L. Svistkov

We present a design for a tunneling-current-assisted scanning near-field microwave microscope. For stable operation at cryogenic temperatures, making a small and rigid microwave probe is important. Our coaxial resonator probe has a length…

Mesoscale and Nanoscale Physics · Physics 2016-06-13 Hideyuki Takahashi , yoshinori imai , Atsutaka Maeda

Recent advances in increasing the spectroscopic energy resolution in scanning tunneling microscopy (STM) have been achieved by integrating electron spin resonance (ESR) with STM. Here, we demonstrate the design and performance of a…

We present a multi-purpose mirror furnace designed for synchrotron X-ray experiments. The furnace is optimized specifically for dark-field X-ray microscopy (DFXM) of crystalline materials at the beamline ID06 of the ESRF. The furnace can…

We demonstrate temperature measurement of a sample attached to the end of a cantilever using cantilever magnetometry of solid air ``contamination'' of the sample surface. In experiments like our Magnetic Resonance Force Microscopy (MRFM),…

Instrumentation and Detectors · Physics 2009-11-07 Kent R. Thurber , Lee E. Harrell , Doran D. Smith

Advances in cryogenic electron microscopy have opened new avenues for probing quantum phenomena in correlated materials. This study reports the installation and performance of a new side-entry condenZero cryogenic cooling system for JEOL…

Strongly Correlated Electrons · Physics 2025-09-30 Young-Hoon Kim , Fehmi Sami Yasin , Na Yeon Kim , Max Birch , Xiuzhen Yu , Akiko Kikkawa , Yasujiro Taguchi , Jiaqiang Yan , Miaofang Chi

We present a versatile and highly configurable scanning acoustic platform. This platform, comprising of a high frequency transducer, bespoke positioning system and temperature-regulated sample unit, enables the acoustic probing of materials…

Materials Science · Physics 2010-02-24 N G Parker , P V Nelson , M J W Povey

We consider an oscillator model to describe qualitatively friction force for an atomic force mi-croscope (AFM) tip driven on a surface described by periodic potential. It is shown that average value of the friction force could be controlled…

Pattern Formation and Solitons · Physics 2020-10-06 E. V. Kazantseva , Y. Braiman , J. Barhen

The Photonic Force Microscope (PFM) is an opto-mechanical technique based on an optical trap that can be assumed to probe forces in microscopic systems. This technique has been used to measure forces in the range of pico- and femto-Newton,…

Data Analysis, Statistics and Probability · Physics 2011-11-10 Giorgio Volpe , Giovanni Volpe , Dmitri Petrov

Atomic Force Microscopy (AFM) operating in the frequency modulation mode with a metal tip functionalized with a CO molecule images the internal structure of molecules with an unprecedented resolution. The interpretation of these images is…

Materials Science · Physics 2022-12-29 Jaime Carracedo-Cosme , Rubén Pérez

Atomic force microscopy (AFM) enables high-resolution imaging and quantitative force measurement, which is critical for understanding nanoscale mechanical, chemical, and biological interactions. In dynamic AFM modes, however, interaction…

Instrumentation and Detectors · Physics 2025-06-10 Simon Laflamme , Bugrahan Guner , Omur E. Dagdeviren

Friction measurements in the range of several meters per second are still of great interests. With the atomic force microscopy (AFM), the oscilaltion situation of the quartz crystal resonators of 3MHz resonance frequency are studied. And…

Mesoscale and Nanoscale Physics · Physics 2013-12-11 Fengzhen Zhang , Othmar Marti , Stefan Walheim , Thomas Schimmel

In this work, we report the integration of an atomic force microscope (AFM) into a helium ion microscope (HIM). The HIM is a powerful instrument, capable of sub-nanometer resolution imaging and machining of nanoscale structures, while the…

Instrumentation and Detectors · Physics 2020-04-02 Santiago H. Andany , Gregor Hlawacek , Stefan Hummel , Charlène Brillard , Mustafa Kangül , Georg E. Fantner
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