We present a versatile and highly configurable scanning acoustic platform. This platform, comprising of a high frequency transducer, bespoke positioning system and temperature-regulated sample unit, enables the acoustic probing of materials over a wide range of length scales and with minimal thermal aberration. In its bare form the platform acts as a reflection-mode acoustic microscope, while optical capabilities are readily incorporated to extend its abilities to the acousto-optic domain. Here we illustrate the capabilities of the platform through its incarnation as an acoustic microscope. Operating at 55 MHz we demonstrate acoustic imaging with a lateral resolution of 25 microns. We outline its construction, calibration and capabilities as an acoustic microscope, and discuss its wider applications.
@article{arxiv.0910.2323,
title = {A versatile scanning acoustic platform},
author = {N G Parker and P V Nelson and M J W Povey},
journal= {arXiv preprint arXiv:0910.2323},
year = {2010}
}
Comments
12 pages, 12 figures. Accepted for publication in Measurement Science and Technology