Related papers: Correction of STEM Distortions
Recent research efforts on Semantic Communication (SemCom) have mostly considered accuracy as a main problem for optimizing goal-oriented communication systems. However, these approaches introduce a paradox: the accuracy of Artificial…
Over the past decade, reflection matrix microscopy (RMM) and advanced image reconstruction algorithms have emerged to address the fundamental imaging depth limitations of optical microscopy in thick biological tissues and complex media. In…
The MARS scanner is designed for the x-ray spectroscopic study of samples with the aid of computer tomography methods. Computer tomography allows the reconstruction of slices of an investigated sample using a set of shadow projections…
This manuscript was originally submitted to Nature for consideration as a "Brief Communication" in response to a "Corrigendum" that appeared in 2006 (1) to an earlier paper in Nature. That corrigendum was the subject of a Nature editorial…
STEM imaging is typically performed by raster scanning a focused electron probe over a sample. Here we investigate and compare three different scan patterns, making use of a programmable scan engine that allows to arbitrarily set the…
High-throughput analysis of multidimensional transmission electron microscopy (TEM) datasets remains a significant challenge, limiting the broader impact on strategic materials research. Conventional workflows typically involve sequential,…
Pixelated detectors in scanning transmission electron microscopy (STEM) generate large volumes of data, often tens to hundreds of GB per scan. However, to make current advancements scalable and enable widespread adoption, it is essential to…
Electron microscopy has shown to be a very powerful tool to map the chemical nature of samples at various scales down to atomic resolution. However, many samples can not be analyzed with an acceptable signal-to-noise ratio because of the…
In this review, automatic defect inspection algorithms that analyze Scanning Electron Microscopy (SEM) images for Semiconductor Manufacturing (SM) are identified, categorized, and discussed. This is a topic of critical importance for the SM…
Recent large-scale text-guided diffusion models provide powerful image-generation capabilities. Currently, a significant effort is given to enable the modification of these images using text only as means to offer intuitive and versatile…
Scanning probe microscopy (SPM) is a valuable technique by which one can investigate the physical characteristics of the surfaces of materials. However, its widespread use is hampered by the time-consuming nature of running an experiment…
Scanning Electron Microscopy (SEM) is pivotal in revealing intricate micro- and nanoscale features across various research fields. However, obtaining high-resolution SEM images presents challenges, including prolonged scanning durations and…
We introduce translation error correction (TEC), the task of automatically correcting human-generated translations. Imperfections in machine translations (MT) have long motivated systems for improving translations post-hoc with automatic…
Current progress in programmable electrostatic phase plates raises questions about their usefulness for specific applications. Here, we explore different designs for such phase plates with the specific goal of correcting spherical…
Scanning transmission electron microscopy (STEM) is the most widespread adopted tool for atomic scale characterization of two-dimensional (2D) materials. Many 2D materials remain susceptible to electron beam damage, despite the standardized…
Modeling artificial scanning electron microscope (SEM) and scanning ion microscope images has recently become important. This is because of the need to provide repeatable images with a priori determined parameters. Modeled artificial images…
We describe the results from a simulation and experimental study of density estimation and beam hardening correction for Bremsstrahlung source computed tomography scan of objects made of a single material. The correction is done using…
Segmentation of nanoscale electron microscopy (EM) images is crucial but still challenging in connectomics research. One reason for this is that none of the existing segmentation methods are error-free, so they require proofreading, which…
Electron tomography has been studied in various fields. Various methods have been developed to align projection sets to construct ideally focused reconstruction. In this paper, we present how to align the projection set to distinguish…
A real-time image reconstruction method for scanning transmission electron microscopy (STEM) is proposed. With an algorithm requiring only the center of mass (COM) of the diffraction pattern at one probe position at a time, it is able to…