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Light-based additive manufacturing techniques enable a rapid transition from object design to production. In these approaches, a 3D object is typically built by successive polymerization of 2D layers in a photocurable resin. A recently…

Recent progress in phase modulation using nanofabricated electron holograms has demonstrated how the phase of an electron beam can be controlled. In this paper, we apply this concept to the correction of spherical aberration in a scanning…

The prospect of neural reconstruction from Electron Microscopy (EM) images has been elucidated by the automatic segmentation algorithms. Although segmentation algorithms eliminate the necessity of tracing the neurons by hand, significant…

Computer Vision and Pattern Recognition · Computer Science 2015-09-29 Toufiq Parag

Purpose: Electromagnetic Tracking (EMT) can potentially complement fluoroscopic navigation, reducing radiation exposure in a hybrid setting. Due to the susceptibility to external distortions, systematic error in EMT needs to be compensated…

Image and Video Processing · Electrical Eng. & Systems 2020-05-25 Henry Krumb , Sofie Hofmann , David Kügler , Ahmed Ghazy , Bernhard Dorweiler , Robert Schmitt , Georgios Sakas , Anirban Mukhopadhyay

The advent of modern, high-speed electron detectors has made the collection of multidimensional hyperspectral transmission electron microscopy datasets, such as 4D-STEM, a routine. However, many microscopists find such experiments daunting…

Integrated silicon photonic devices, which manipulate light to transmit and process information on a silicon-on-insulator chip, are highly sensitive to structural variations. Minor deviations during nanofabrication-the precise process of…

Computer Vision and Pattern Recognition · Computer Science 2024-11-27 Rambod Azimi , Yijian Kong , Dusan Gostimirovic , James J. Clark , Odile Liboiron-Ladouceur

Understanding elementary mechanisms behind solid-state phase transformations and reactions is the key to optimizing desired functional properties of many technologically relevant materials. Recent advances in scanning transmission electron…

In this publication we introduce MAM-STM, a software to autonomously manipulate arbitrary moieties towards specific positions on a metal surface utilizing the tip of a scanning tunneling microscope (STM). Finding the optimal manipulation…

Applied Physics · Physics 2024-04-16 Bernhard Ramsauer , Johannes J. Cartus , Oliver T. Hofmann

The use of differential phase contrast (DPC) in scanning transmission electron microscopy (STEM) has shown much promise for directly investigating the functional properties of a material system, leveraging the natural coupling between the…

Materials Science · Physics 2025-12-04 Rafael V. Ferreira , Sebastian Calderon V. , Paulo J. Ferreira

Scanning Electron Microscopes (SEMs) are widely renowned for their ability to analyze the surface structures of microscopic objects, offering the capability to capture highly detailed, yet only grayscale, images. To create more expressive…

Computer Vision and Pattern Recognition · Computer Science 2024-10-30 Takuma Nishimura , Andreea Dogaru , Martin Oeggerli , Bernhard Egger

Scene text editing (STE) aims to replace text with the desired one while preserving background and styles of the original text. However, due to the complicated background textures and various text styles, existing methods fall short in…

Computer Vision and Pattern Recognition · Computer Science 2022-12-06 Yadong Qu , Qingfeng Tan , Hongtao Xie , Jianjun Xu , Yuxin Wang , Yongdong Zhang

Scientific applications often require an exact reconstruction of object positions and distances from digital images. Therefore, the images need to be corrected for perspective distortions. We present \textit{CameraTransform}, a python…

Mathematical Software · Computer Science 2019-10-04 Richard Gerum , Sebastian Richter , Alexander Winterl , Ben Fabry , Daniel Zitterbart

The scanning electron microscope (SEM) produces an image of a sample by scanning it with a focused beam of electrons. The electrons interact with the atoms in the sample, which emit secondary electrons that contain information about the…

Computer Vision and Pattern Recognition · Computer Science 2017-09-08 Shahar Tsiper , Or Dicker , Idan Kaizerman , Zeev Zohar , Mordechai Segev , Yonina C. Eldar

Diffusion models excel in solving imaging inverse problems due to their ability to model complex image priors. However, their reliance on large, clean datasets for training limits their practical use where clean data is scarce. In this…

Computer Vision and Pattern Recognition · Computer Science 2024-07-02 Weimin Bai , Yifei Wang , Wenzheng Chen , He Sun

In this work, we address the limitations of denoising diffusion models (DDMs) in image restoration tasks, particularly the shape and color distortions that can compromise image quality. While DDMs have demonstrated a promising performance…

Computer Vision and Pattern Recognition · Computer Science 2024-12-18 Xinlong Cheng , Tiantian Cao , Guoan Cheng , Bangxuan Huang , Xinghan Tian , Ye Wang , Xiaoyu He , Weixin Li , Tianfan Xue , Xuan Dong

The alignment of serial-section electron microscopy (ssEM) images is critical for efforts in neuroscience that seek to reconstruct neuronal circuits. However, each ssEM plane contains densely packed structures that vary from one section to…

Computer Vision and Pattern Recognition · Computer Science 2017-12-06 Inwan Yoo , David G. C. Hildebrand , Willie F. Tobin , Wei-Chung Allen Lee , Won-Ki Jeong

LLMs increasingly require surgical model editing to enhance domain-specific capabilities without incurring the computational cost or catastrophic forgetting associated with full fine-tuning. Sparse Autoencoders (SAEs) have emerged as a…

Machine Learning · Computer Science 2026-05-28 Li Lei , Madalina Ciobanu , Qingqing Mao , Ritankar Das

Although large language models (LLMs) have achieved remarkable performance across various tasks, they remain prone to errors. A key challenge is enabling them to self-correct. While prior research has relied on external tools or large…

Computation and Language · Computer Science 2025-03-12 Viktor Moskvoretskii , Chris Biemann , Irina Nikishina

In this review article fundamentals of aberration corrected phase contrast transmission electron microscopy for the structural characterization of materials at atomic length scale is presented. The word structure entails atomic arrangement…

Materials Science · Physics 2026-03-26 Ranjan Datta , Sneha Kobri M. , Sudip Mahato

Material properties strongly depend on the nature and concentration of defects. Characterizing these features may require nano- to atomic-scale resolution to establish structure-property relationships. 4D-STEM, a technique where diffraction…

Materials Science · Physics 2023-05-03 Stephanie M. Ribet , Colin Ophus , Roberto dos Reis , Vinayak P. Dravid
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