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We introduce EC-SLAM, a real-time dense RGB-D simultaneous localization and mapping (SLAM) system leveraging Neural Radiance Fields (NeRF). While recent NeRF-based SLAM systems have shown promising results, they have yet to fully exploit…

High-Resolution Electron Backscatter Diffraction (HR-EBSD) has advanced rapidly in recent years, significantly improving elastic strain measurements and dislocation density evaluation with submicron spatial resolution. To achieve better…

For high (angular) resolution electron backscatter diffraction (HR-EBSD), the selection of a reference diffraction pattern (EBSP0) significantly affects the precision of the calculated strain and rotation maps. This effect was demonstrated…

This paper introduces embComp, a novel approach for comparing two embeddings that capture the similarity between objects, such as word and document embeddings. We survey scenarios where comparing these embedding spaces is useful. From those…

Printed Circuit Boards (PCBs) are critical components in modern electronics, which require stringent quality control to ensure proper functionality. However, the detection of defects in small-scale PCBs images poses significant challenges…

Convergent-beam electron diffraction (CBED) is a well-established probe for spatial symmetries of crystalline samples, mainly exploiting the well-defined mapping between the diffraction groups (symmetry group of CBED patterns) and the…

A growing body of work studies Blindspot Discovery Methods ("BDM"s): methods that use an image embedding to find semantically meaningful (i.e., united by a human-understandable concept) subsets of the data where an image classifier performs…

Contrastive self-supervised learning has attracted significant research attention recently. It learns effective visual representations from unlabeled data by embedding augmented views of the same image close to each other while pushing away…

Electron Backscattering Diffraction (EBSD) provides important information to discriminate phase transformation products in steels. This task is conventionally performed by an expert, who carries a high degree of subjectivity and requires…

Embedding models trained separately on similar data often produce representations that encode stable information but are not directly interchangeable. This lack of interoperability raises challenges in several practical applications, such…

The accuracy of the information that can be extracted from electron diffraction patterns is often limited by the presence of optical distortions. Existing distortion characterization techniques typically require knowledge of the reciprocal…

Galactic dust emission is often accounted for in cosmic microwave background (CMB) analyses by fitting a simple two-parameter modified blackbody (MBB) model in each pixel, which nominally accounts for the temperature and opacity of the…

Electron channeling contrast imaging (ECCI) is a scanning electron microscopy (SEM) based technique that enables bulk-sample characterization of crystallographic defects (e.g. dislocations, stacking faults, low angle boundaries). Despite…

Scanning Transmission Electron Microscopy (STEM) enables the observation of atomic arrangements at sub-angstrom resolution, allowing for atomically resolved analysis of the physical and chemical properties of materials. However, due to the…

Electrical capacitance tomography (ECT) is a nonoptical imaging technique in which a map of the interior permittivity of a volume is estimated by making capacitance measurements at its boundary and solving an inverse problem. While previous…

Aberration-corrected environmental transmission electron microscopy (ETEM) enables atomic-resolution imaging of dynamic catalytic processes. Correlating atomic-scale structural changes with reaction products detected by mass spectrometry…

The advent of modern, high-speed electron detectors has made the collection of multidimensional hyperspectral transmission electron microscopy datasets, such as 4D-STEM, a routine. However, many microscopists find such experiments daunting…

Transmission Electron Microscopy (TEM) is a powerful tool for imaging material structure and characterizing material chemistry. Recent advances in data collection technology for TEM have enabled high-volume and high-resolution data…

Accurate 3D reconstruction using multi-camera RGB-D systems critically depends on precise extrinsic calibration to achieve proper alignment between captured views. In this paper, we introduce an iterative extrinsic calibration method that…

The transmission electron microscope facilitates the highest-resolution imaging of any instrument ever created, and its limiting factor is no longer spatial resolution but dose efficiency. Low electron doses avoid sample damage but produce…