Related papers: UV-enhanced SEM: towards orientation and electron …
We present results from the characterization of a vertically stacked amorphous selenium (aSe)-based photodetector for use in cryogenic environments. aSe has been identified as an ideal photoconductor that can efficiently convert vacuum…
State-of-the-art electron microscopes such as scanning electron microscopes (SEM), scanning transmission electron microscopes (STEM) and transmission electron microscopes (TEM) have become increasingly sophisticated. However, the quality of…
A critical technology for high-volume manufacturing of nanoscale integrated circuits is a high-power extreme ultraviolet (EUV) light source. Over the past decades, laser-produced plasma (LPP) sources have been actively utilized in this…
Cylindrical vector (CV) gamma rays can introduce spatially structured polarization as a new degree of freedom for fundamental research and practical applications. However, their generation and control remain largely unexplored. Here, we put…
Scanning transmission electron microscopy (STEM) has advanced rapidly in the last decade thanks to the ability to correct the major aberrations of the probe forming lens. Now atomic-sized beams are routine, even at accelerating voltages as…
We consider the orientational alignment of dipoles due to strong matter light coupling, for a non-vanishing density of excitations. We compare various approaches to this problem in the limit of large numbers of emitters, and show that…
Scanning electron microscopy combined with electron backscatter diffraction (EBSD) and electron channeling provides rich crystallographic contrast, but the mutual influence of channeling-in and channeling-out is often simplified or…
The polarization state of light is a key parameter in many imaging systems. For example, it can image mechanical stress and other physical properties that are not seen with conventional imaging, and can also play a central role in quantum…
The electric dipole moment of the electron (eEDM) can be measured with high precision using heavy polar molecules. In this paper, we report on a series of new techniques that have improved the statistical sensitivity of the YbF eEDM…
The ability to engineer metamaterials with tunable nonlinear optical properties is crucial for nonlinear optics. Traditionally, metals have been employed to enhance nonlinear optical interactions through field localization. Here, inspired…
Low-energy electron microscopy (LEEM) is a surface science method that works primarily in the UHV environment. It provides information complementary to the other established techniques: it extends the limited view of scanning probe…
Semiconductor dopant profiling using secondary electron imaging in a scanning electron microscope (SEM) has been developed in recent years. In this paper, we show that the mechanism behind it also allows mapping of the electric potential of…
Developing tunable photodetectors that can operate over a wide range of wavelengths and integrating them into integrated circuits is a significant challenge in today's technology. These devices must be miniaturized, inexpensive, and easily…
Leveraging the full scientific capabilities of next-generation high-repetition-rate free-electron lasers requires programmable control over electron-beam properties at their source. The photoinjector drive laser defines the electron beam's…
Pixelated silicon detectors are state-of-the-art technology to achieve precise tracking and vertexing at collider experiments, designed to accurately measure the hit position of incoming particles in high rate and radiation environments.…
Porosity variations in tubular scaffolds are critical to reproducible, sophisticated applications of electrospun fibers in biomedicine. Established laser micrometry techniques produced ~14,000 datapoints enabling thickness and porosity…
This research thesis presents a novel higher-order spectral element method (SEM) formulated in cylindrical coordinates for analyzing electromagnetic fields in waveguides filled with complex anisotropic media. In this study, we consider a…
The scanning electron microscope (SEM) recordings of dynamic nano-electromechanical systems (NEMS) are difficult to analyze due to the noise caused by low frame rate, insufficient resolution and blurriness induced by applied electric…
We adapted a conventional microscope for projection photolithography using an ultraviolet (UV) light-emitting diode (LED) as a light source. The use of a UV LED provides the microscope projector with several advantages in terms of…
The scanning electron microscopy (SEM) is probably one the most fascinating examination approach that has been used since more than two decades to detailed inspection of micro scale objects. Most of the scanning electron microscopes could…