Related papers: RASP: Reliability ab initio simulation package of …
This note studies the robust output feedback stabilization problem of multi-input multi-output invertible nonlinear systems with output-dependent multipliers. An "ideal" state feedback is first designed under certain mild assumptions. Then,…
Defect engineering is a key strategy to control resistive switching (RS) in oxide-based memristive devices, where oxygen vacancy (OV) dynamics governs filament formation and rupture. We investigate the effect of Ag nanoparticles (AgNPs)…
Accurate grid load forecasting is safety-critical: under-predictions risk supply shortfalls, while symmetric error metrics can mask this operational asymmetry. We introduce an operator-legible evaluation framework -- Under-Prediction Rate…
Digital controller design for nonlinear systems may be complicated by the fact that an exact discrete-time plant model is not known. One existing approach employs approximate discrete-time models for stability analysis and control design,…
Power systems, including synchronous generator systems, are typical systems that strive for stable operation. In this article, we numerically study the fault transient process of a synchronous generator system based on the first benchmark…
In this paper, the robust distributed relay beamforming problem is solved using the worst case approach, where the problem solution has been involved because of the effect of uncertainty of channel knowledge on the quality of service (QoS)…
We present a framework for the realization of dissipative evolutions of spin-boson models, including multiphoton exchange dynamics, as well as nonlinear transition rates. Our approach is based on the implementation of a generalized version…
Software reliability growth models (SRGM) enable failure data collected during testing. Specifically, nonhomogeneous Poisson process (NHPP) SRGM are the most commonly employed models. While software reliability growth models are important,…
In high-power applications, multiple power MOSFETs are connected in parallel and treated as a single switch in order to handle much larger total currents. In this paper, a parallel power MOSFETs model from the turnoff state until they reach…
We introduce an algorithm for detection of bugs in sequential circuits. This algorithm is incomplete i.e. its failure to find a bug breaking a property P does not imply that P holds. The appeal of incomplete algorithms is that they scale…
The semiparametric accelerated failure time (AFT) model offers a direct and interpretable alternative to the Cox proportional hazards model, yet practical diagnostic tools for this framework remain limited. We introduce afttest, an R…
New generations of power systems, containing high shares of renewable energy resources, require improved data-driven tools which can swiftly adapt to changes in system operation. Many of these tools, such as ones using machine learning,…
We study estimation in the linear model $y=A\beta^\star+\epsilon$, in a Bayesian setting where $\beta^\star$ has an entrywise i.i.d. prior and the design $A$ is rotationally-invariant in law. In the large system limit as dimension and…
With the increasing complexity of power systems,accurately identifying critical states (the states corresponding to minimal cut sets) and assessing system reliability have become crucial tasks. In this paper, a mathematical lattice…
Transient stability analysis (TSA) plays an important role in power system analysis to investigate the stability of power system. Traditionally, transient stability analysis methods have been developed using time domain simulation by means…
Usually, methods evaluating system reliability require engineers to quantify the reliability of each of the system components. For series and parallel systems, there are some options to handle the estimation of each component's reliability.…
We study a class of real robust phase retrieval problems under a Gaussian assumption on the coding matrix when the received signal is sparsely corrupted by noise. The goal is to establish conditions on the sparsity under which the input…
As we approach the physical limits of CMOS technology, advances in materials science and nanotechnology are making available a variety of unconventional computing substrates that can potentially replace top-down-designed silicon-based…
Resistance-change random access memory (RRAM) devices are nanoscale metal-insulator-metal structures that can store information in their resistance states, namely the high resistance (HRS) and low resistance (LRS) states. They are a…
Assembly state recognition facilitates the execution of assembly procedures, offering feedback to enhance efficiency and minimize errors. However, recognizing assembly states poses challenges in scalability, since parts are frequently…