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Imaging dynamical processes at interfaces and on the nanoscale is of great importance throughout science and technology. While light-optical imaging techniques often cannot provide the necessary spatial resolution, electron-optical…
A resolution-enhanced dark-field microscope by structured light illumination is proposed to improve resolution and contrast. A set of phase-shifted fringes are projected to the sample plane at large angle to capture modulated dark-field…
Single-pixel imaging, originally developed in light optics, facilitates fast three-dimensional sample reconstruction, as well as probing with light wavelengths undetectable by conventional multi-pixel detectors. However, the spatial…
Instruments to visualize transient structural changes of inhomogeneous materials on the nanometer scale with atomic spatial and temporal resolution are demanded to advance materials science, bioscience, and fusion sciences. One such…
Oblique plane microscopy is a method enabling light-sheet fluorescence imaging through a single microscope objective lens by focusing on a tilted plane within the sample. To focus the fluorescence emitted by the oblique plane on a camera,…
Aberration-corrected optics have made electron microscopy at atomic-resolution a widespread and often essential tool for nanocharacterization. Image resolution is dominated by beam energy and the numerical aperture of the lens ({\alpha}),…
Probing optical excitations with nanometer resolution is important for understanding their dynamics and interactions down to the atomic scale. Electron microscopes currently offer the unparalleled ability of rendering spatially-resolved…
Light-field cameras (LFC) have received increasing attention due to their wide-spread applications. However, current LFCs suffer from the well-known spatio-angular trade-off, which is considered as an inherent and fundamental limit for LFC…
We present a study of 3D electromagnetic field zeros, uncovering their remarkable characteristic features and propose a classifying framework. These are a special case of general dark spots in optical fields, which sculpt light's spatial…
A new numerically and experimentally tested measurement method for the local electrical light field including its phase is presented. The method is based on Self Referencing Interferograms (SRI) such as shearing interferograms. The complex…
The resolution of optical imaging devices is ultimately limited by the diffraction of light. To circumvent this limit, modern super-resolution microscopy techniques employ active interaction with the object by exploiting its optical…
We demonstrate an electro-optic wide-field method to enable fluorescence lifetime microscopy (FLIM) with high throughput and single-molecule sensitivity. Resonantly driven Pockels cells are used to efficiently gate images at 39 MHz,…
The ability to image electromagnetic fields holds key scientific and industrial applications, including electromagnetic compatibility, diagnostics of high-frequency devices, and experimental scientific work involving field interactions.…
The pursuit of ever-shorter time scales is a frontier in modern physics, exemplified by the synthesis of attosecond light pulses -- an achievement made possible by coherently superimposing a broad range of photon energies, as required by…
Microscopy has been key to tremendous advances in science, technology, and medicine, revealing structure and dynamics across time and length scales. However, combining high spatial and temporal resolution in a non-invasive, label-free…
Light emission is defined by its distribution in energy, momentum, and polarization. Here, we demonstrate a method that resolves these distributions by means of wide-angle energy-momentum spectroscopy. Specifically, we image the back focal…
The progress of semiconductor electronics toward ever-smaller length scales and associated higher power densities brings a need for new high-resolution thermal microscopy techniques. Traditional thermal microscopy is performed by detecting…
Aperture based scanning near field optical microscopes are important instruments to study light at the nanoscale and to understand the optical functionality of photonic nanostructures. In general, a detected image is affected by both, the…
Achieving atomic resolution in electron microscopy has historically been hindered by spherical aberration, a fundamental limitation of conventional electron lenses. Its correction typically requires complex assemblies of electromagnetic…
The resolution of far-field optical microscopes, which rely on propagating optical modes, is widely believed to be limited because of diffraction to a value on the order of a half-wavelength $\lambda /2$ of the light used. Although…